Possible Radiation-Induced Damage to the Molecular Structure of Wooden Artifacts Due to Micro-Computed Tomography, Handheld X-Ray Fluorescence, and X-Ray Photoelectron Spectroscopic Techniques

Authors

Madalena KozachukFollow
Alexandra Suda
Lisa Ellis
Mary Walzak
Mark Biesinger
Sheila MacfieFollow
Robert HudsonFollow
Andrew NelsonFollow
Ronald MartinFollow
Arlen Heginbotham

Document Type

Article

Publication Date

5-20-2016

Journal

Journal of Conservation and Museum Studies

Volume

14

Issue

1

First Page

1

Last Page

6

URL with Digital Object Identifier

http://doi.org/10.5334/jcms.126

Abstract

This study was undertaken to ascertain whether radiation produced by X-ray photoelectron spectroscopy (XPS), micro-computed tomography (μCT) and/or portable handheld X-ray fluorescence (XRF) equipment might damage wood artifacts during analysis. Changes at the molecular level were monitored by Fourier transform infrared (FTIR) analysis. No significant changes in FTIR spectra were observed as a result of μCT or handheld XRF analysis. No substantial changes in the collected FTIR spectra were observed when XPS analytical times on the order of minutes were used. However, XPS analysis collected over tens of hours did produce significant changes in the FTIR spectra.

Notes

The final publication can be found here: http://doi.org/10.5334/jcms.126